ISBN 9780471241416,In Situ Real-Time Characterization of Thin Films

In Situ Real-Time Characterization of Thin Films

Publisher:

Wiley-blackwell

Rs9235 Rs11280 18% OFF

Availability: Out of Stock

(Free Delivery)

We Accept
ISBN 9780471241416
Check delivery information
 
ISBN 9780471241416
Publisher

Wiley-blackwell

Publication Year 2000
ISBN-13

ISBN 9780471241416

ISBN-10 0471241415
Binding

Hardback

Number of Pages 280 Pages
Language (English)
Subject

Medical genetics

With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include:
* Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes
* Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces
* Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials
* Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes
* X-ray fluorescence spectroscopy for studying surface and interface structures
* And other cost-effective techniques for industrial application

About the Author

ORLANDO AUCIELLO, PhD, is a Senior Scientist at the Argonne National Laboratory. ALAN R. KRAUSS, PhD, (deceased) was a Senior Scientist at the Argonne National Laboratory.
Scroll