ISBN 9781439829417,Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits

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ISBN 9781439829417
Publisher

CRC Press

Publication Year 2013
ISBN-13

ISBN 9781439829417

ISBN-10 1439829411
Binding

Hardback

Number of Pages 259 Pages
Subject

Circuits & components

N.A.
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