ISBN 9781845699345,In-Situ Characterisation of Thin Film Growth

In-Situ Characterisation of Thin Film Growth

Rs11302 Rs16146 30% OFF

Publisher

Woodhead Publishing

Publication Year 2012
ISBN-13

ISBN 9781845699345

ISBN-10 1845699343
Binding

Hardback

Number of Pages 296 Pages
Subject

Semi-conductors & super-conductors

Part one reviews electron diffraction techniques, including the methodology for taking observations and measurements. Part two covers photoemission techniques; the principles and instrumentation. Part three contains alternative in-situ characterisation techniques and the trend for combining different techniques.

More from Author

Scroll